UC知道材料专业英语翻译(很短)(英译中) 用翻译软件就免了40
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7.3.2.4 Ex situ Characterization of the Growth of Metal Oxide Films
The most commonly used ex situ structural characterization technique is X-ray
diffraction. After the growth of multilayer films, the thickness as well as the smoothness
of the films can be characterized using X-ray diffraction technique. Figure 7.10 is a
typical X-ray diffraction pattern of a YBCO/PrBa2Cu3O7 (PrBCO) superlattice showing
satellite peaks around the (001) and (002) peaks of a YBCO/PrBCO. Since the
superlattice structures consist of alternate layers of two different materials, it creates a
new periodicity. The modulation thickness in superlattices is measured by the position
of satellite peaks, which is given by
The most commonly used ex situ structural characterization technique is X-ray
diffraction. After the growth of multilayer films, the thickness as well as the smoothness
of the films can be characterized using X-ray diffraction technique. Figure 7.10 is a
typical X-ray diffraction pattern of a YBCO/PrBa2Cu3O7 (PrBCO) superlattice showing
satellite peaks around the (001) and (002) peaks of a YBCO/PrBCO. Since the
superlattice structures consist of alternate layers of two different materials, it creates a
new periodicity. The modulation thickness in superlattices is measured by the position
of satellite peaks, which is given by
7.3.2.4易地表征的增长，金属氧化物薄膜
最常用的易地结构表征技术是X射线
衍射。后的增长多层薄膜，厚度，以及为光滑
该薄膜的特点是可以用X射线衍射技术。图7.10是一个
典型的X射线衍射图一ybco/prba2cu3o7 （ prbco ）超晶格显示
卫星峰周围（ 001 ）和（ 002 ）峰一YBCO结构/ prbco 。自
超晶格结构的构成候补层次的两种不同的材料，它创建一个
新的周期。调制厚度在超晶格是衡量立场
卫星峰，这是所给予的