Help me,hurry (翻译)

来源：百度知道 编辑：UC知道 时间：2024/06/30 19:06:11
Focused Ion Beam(聚焦离子束)

-In term of failure analysis, FIB techniques are commonly used in high magnification microscopy,die surface milling or cross-sectioning,and even material deposition.
-A FIB system work very similarly to ascanning electron microscopy,except that is uses a finely focused beam of gallium(Ga+) ions instead of the latter’s use of electrons. This focused primary beam of gallium ions is rastered(scanned) on the surface of material to be analyed.As it hits the surface ,a small amount of material is sputtered or dislodged from the surface.
-The dislodged material may be in the form of secondary ions,atoms, and secondary electrons.These ions ,atoms, and electrons are then collected and analyzed as analyed as signals to form an image on a screen as the primary beams saans the surface ,This image forming capability allows high magnification miccroscopy.
-The higher the primary beam current,the more material is sputtered from the surface. If only h

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-In term of failure analysis, FIB techniques are commonly used in high magnification microscopy, die surface milling or cross-sectioning, and even material deposition.
就故障分析而言，聚焦离子束技术常用于高度放大率的显微术，模具型面铣削或剖面切削，甚至物质沉着研究。

-A FIB system work very similarly to a scanning electron microscopy, except that it uses a finely focused beam of gallium(Ga+) ions instead of the latter’s use of electrons. This focused primary beam of gallium ions is rastered (scanned) on the surface of material to be analyzed. As it hits the surface ,a small amount of material is sputtered or dislodged from the surface.
聚焦离子束系统的操作与扫描电子显微术很相似，不同的是它使用很精细的镓（Ga+）离子聚焦光束，而后者是使用电子。这聚焦的镓离子原射束在被分析的材料表面作光栅式扫描，当接触表面时，少数材料会从表面飞溅或喷出。

-The dislodged material may be in the form of secondary ions, atoms, and secondary electrons. These ions ,atoms, and electrons are then collected and analyzed as signals to form an image on a sc