请教各位高手以下文字如何翻译呀?先谢了!

来源:百度知道 编辑:UC知道 时间:2024/06/30 22:51:29
Development HALT (Highly Accelerated Life Testing) is an intensive process to uncover design and manufacturing weaknesses in an electronic product. The test units are subjected to progressively higher stress levels by extreme temperature transitions, vibration, and combined environments. The intent is to stress the product well beyond normal operating conditions and determine the operating and destruct limits of the product.

As each failure occurs, the failure is repaired so testing can continue to higher stress
levels. This allows a sequence of failures to occur up to the extreme stress limits.

The ultimate goal is to determine the root cause of each failure, and then correct each failure mode. This process can allow the product to reach the fundamental limit of its technology. This will dramatically reduce failures in the field due to aging or other stressful operating conditions.

发展止步不前(高度加速寿命试验) 是一个密集的过程揭露设计和制造的弱点在一个电子产品。测试单位被服从对进步地更高的压力水平由极端温度转折、振动, 和联合的环境。意向是注重产品很好在正常工作状态之外和确定经营和自毁产品的极限。 当各失败发生, 失败被修理因此测试可能继续更高注重 水平。这允许疏忽序列发生由极端重音极限决定。 最终目标是确定各失败的起因, 和然后改正各种失败形式。这个过程可能允许产品到达它的技术根本极限。这显著将减少失败在领域由于老化或其它紧张操作条件。

发展停顿(高加速寿命试验)是一个密集的设计和制造过程中发现弱点电子产品. 试验单位遭受胁迫更高层次逐步过渡到极端温度、振动、环境结合. 意图是要强调产品远远超出正常的营运状况,确定经营范围和毁灭 产品. 由于每个中断,测试失败是可以继续修理等更高层次的应力. 这使故障发生了一连串的极端应力极限. 最终目标是要确定每个失败的根源,进而正确每个故障模式. 这个过程可以让产品达到它的根本极限技术. 这将大大减少因故障在外地或其他时效压力下操作.